Full Description

The neutron irradiation test is performed to determine the susceptibility of semiconductor devices to non-ionizing energy loss (NIEL) degradation. The test described herein is applicable to integrated circuits and discrete semiconductor devices and is intended for military- and aerospace-related applications. It is a destructive test.

The objectives of the test are as follows:

a) to detect and measure the degradation of critical semiconductor device parameters as a function of neutron fluence, and
b) to determine if specified semiconductor device parameters are within specified limits after exposure to a specified level of neutron fluence (see Clause 6).

Cross References:
ASTM E 265
ASTM E 264
ASTM E 263
ASTM E 721
MIL-STD-883
ASTM E 1018
ASTM E 722
ASTM E 720
ASTM E 668
ASTM E 2450


All current amendments available at time of purchase are included with the purchase of this document.

Product Details

Published: 05/15/2019 ISBN(s): 9780539000627 Number of Pages: 12 File Size: 1 file , 870 KB Product Code(s): 30373810, 30373810, 30373810 Note: This product is unavailable in United Kingdom